CVE-2024-53017 (GCVE-0-2024-53017)
Vulnerability from cvelistv5
Published
2025-06-03 05:52
Modified
2025-06-03 13:32
Severity ?
6.6 (Medium) - CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
CWE
  • CWE-823 - Use of Out-of-range Pointer Offset
Summary
Memory corruption while handling test pattern generator IOCTL command.
References
Impacted products
Vendor Product Version
Qualcomm, Inc. Snapdragon Version: SDM429W
Version: Snapdragon 429 Mobile Platform
Version: WCN3620
Version: WCN3660B
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