fkie_cve-2024-53017
Vulnerability from fkie_nvd
Published
2025-06-03 06:15
Modified
2025-08-20 20:24
Severity ?
6.6 (Medium) - CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Summary
Memory corruption while handling test pattern generator IOCTL command.
References
product-security@qualcomm.comhttps://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.htmlVendor Advisory
Impacted products
Vendor Product Version
qualcomm sdm429w_firmware -
qualcomm sdm429w -
qualcomm snapdragon_429_mobile_platform_firmware -
qualcomm snapdragon_429_mobile_platform -
qualcomm wcn3620_firmware -
qualcomm wcn3620 -
qualcomm wcn3660b_firmware -
qualcomm wcn3660b -


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  "id": "CVE-2024-53017",
  "lastModified": "2025-08-20T20:24:55.310",
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  "published": "2025-06-03T06:15:24.793",
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